Quantitative EDX and EELS Elemental Mapping at Atomic Resolution
نویسندگان
چکیده
منابع مشابه
Atomic resolution mapping of phonon excitations in STEM-EELS experiments.
Atomically resolved electron energy-loss spectroscopy experiments are commonplace in modern aberration-corrected transmission electron microscopes. Energy resolution has also been increasing steadily with the continuous improvement of electron monochromators. Electronic excitations however are known to be delocalized due to the long range interaction of the charged accelerated electrons with th...
متن کاملHigh Resolution Quantitative Susceptibility Mapping at 9.4T
INTRODUCTION Susceptibility weighted imaging at ultrahigh magnetic fields (B0≥7T) has become a new forefront of research, triggered by the anticipated increase in signal-to-noise ratio (SNR), higher spatial resolution, and improved contrast mechanisms. Employing these advantages superb anatomical contrast has already been demonstrated for both magnitude [1,2] and phase images [2-4]. These phase...
متن کاملIs there a Stobbs factor in atomic-resolution STEM-EELS mapping?
Recent work has convincingly argued that the Stobbs factor-disagreement in contrast between simulated and experimental atomic-resolution images-in ADF-STEM imaging can be accounted for by including the incoherent source size in simulation. However, less progress has been made for atomic-resolution STEM-EELS mapping. Here we have performed carefully calibrated EELS mapping experiments of a [101]...
متن کاملElemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy.
We present atomic-resolution energy-filtered transmission electron microscopy (EFTEM) images obtained with the chromatic-aberration-corrected FEI Titan PICO at the Ernst-Ruska Centre, Jülich, Germany. We find qualitative agreement between experiment and simulation for the background-subtracted EFTEM images of the Ti-L2,3 and O-K edges for a specimen of SrTiO3 oriented down the [110] zone axis. ...
متن کاملAtomic Column Elemental Mapping by STEM-Moiré Method
Atomic column elemental mapping is realized by electron energy loss spectroscopy (EELS) and/or energy dispersive X-ray spectroscopy (EDS) [1], with modern technologies of electron microscopy such as an aberration corrector [2]. The method is widely utilized in materials and physical sciences, since atomic species and positions in a crystalline specimen can be determined directly. A crucial issu...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614004577